| PART |
Description |
Maker |
| GET-30497 |
Qualification Test Results on Si MMIC
|
California Eastern Labs
|
| GET-30497 |
Qualification Test Results on Si MMIC 资质测试结果对硅单片
|
California Eastern Laboratories, Inc.
|
| GET-30593 |
Qualification Test Report on NE681XX
|
California Eastern Labs
|
| GET-BC-0004 |
Qualification Test Report on NE292
|
California Eastern Laboratories
|
| TQ8223 |
Device Qualification
|
TriQuint Semiconductor
|
| AT25F512A |
SPI EEPROM PRODUCT QUALIFICATION
|
ATMEL Corporation
|
| EFM32ZG222F4-QFP48 |
Updated specifications based on the results of additional silicon characterization.
|
Silicon Laboratories
|
| EFM32WG995F128-BGA120 EFM32WG995F256-BGA120 EFM32W |
Updated specifications based on the results of additional silicon characterization
|
Silicon Laboratories
|
| KLL5817 KLL5818 |
Reliable Low Cost Construction Utilizing Molded Plastic Technique Results in Inexpensive Product
|
TY Semiconductor Co., Ltd
|
| AS8221-ASSP |
FlexRay??Standard Transceiver; Package Type: SSOP-20; Temperature Range: -40 - 125 掳C; Automotive Qualification: X
|
Austriamicrosystems AG
|
| 0040.1022 0040.1023 0040.1021 40.1024-ND 0040.1151 |
TEST JACKS, TEST PROBES
|
Schurter Inc.
|
